On the Impact of Hardware Faults – An Investigation of the Relationship between Workload Inputs and Failure Mode Distributions
Technology scaling of integrated circuits is making transistors increasingly sensitive to process variations, wear-out effects and ionizing particles. This may lead to an increasing rate of transient and intermittent errors in future microprocessors. In
Authors : Domenico Di Leo, Fatemeh Ayatolahi, Behrooz Sangchoolie, Johan Karlsson, Roger Johansson
Year : 2012
Published in : Computer Safety, Reliability, and Security. Eds: Frank Ortmeier, Peter Daniel. SAFECOMP, Mageburg, Germany, September 25-28, 2012. (0302-9743). Vol. 7612 (2012), p. 198-209.